Characterization of Organic Thin Films (BOK)

Abraham Ulman

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Thin films based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering. This volume in the "Materials Characterization" series introduces the major common types of analysis used in characterizing of thin films and the various appropriate characterization technologies for each. Materials such as Langmuir-Blodgett films and self-assembled monolayers are first introduced, followed by analysis of surface properties and the various characterization technologies used for such. Readers will find detailed information on: various spectroscopic approaches to characterization of organic thin films, including infrared spectroscopy and Raman spectroscopy X-Ray diffraction techniques, High Resolution EELS studies, and X-Ray Photoelectron Spectroscopy; concise summaries of major characterization technologies for organic thin films, including Auger Electron Spectroscopy, Dynamic Secondary Ion Mass Spectrometry, and Transmission Electron Microscopy (TEM).

Produktfakta

Språk Engelsk Engelsk Innbinding Innbundet
Utgitt 2010 Forfatter Abraham Ulman
Forlag
Momentum Press
ISBN 9781606500446
Antall sider 276 Dimensjoner 15,4cm x 24,1cm x 1,8cm
Vekt 586 gram Leverandør Bertram Trading Ltd
Emner og form Materials science