Cluster Secondary Ion Mass Spectrometry: Principles and Applications (BOK)

Christine M. Mahoney

1 069,00 1 06900
Sendes vanligvis innen 5-15 dager
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.


Språk Engelsk Engelsk Innbinding Innbundet
Utgitt 2013 Forfatter Christine M. Mahoney
ISBN 9780470886052
Antall sider 368 Dimensjoner 16,2cm x 23,4cm x 2,3cm
Vekt 764 gram Leverandør Bertram Trading Ltd
Emner og form Spectrum analysis, spectrochemistry, mass spectrometry