Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII (BOK)

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII (BOK)

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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Produktfakta

Språk Engelsk Engelsk Innbinding Heftet
Utgitt 2013 Forlag
Turpin DEDS Orphans
ISBN 9780819496690 Antall sider 277
Dimensjoner 15cm x 21cm x 2,2cm Vekt 381 gram
Leverandør Bertram Trading Ltd Andre medvirkende Michael T. Postek
Emner og form Applied optics