Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electrical Devices and (BOK)

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Symposium G, 'Reliability and Materials Issues of III-V and II-VI Semiconductor Optical and Electron Devices and Materials II', was held April 9-13 at the 2012 MRS Spring Meeting in San Francisco, California. Achieving high reliability is a key issue for semiconductor optical and electrical devices and is as important as device performance for commercial application. Degradation of both optical and electrical devices is strongly related to the materials issues. A variety of material defects can occur during the device fabrication processes, i.e., crystal growth, impurity diffusion, ion-implantation, wet/dry etching, metallisation, bonding, packaging, etc. This symposium presented state-of-the-art results on reliability and degradation of various semiconductor optical and electrical devices as well as their materials issues in thin-film growth, wafer processing and device fabrication processes.

Produktfakta

Språk Engelsk Engelsk Innbinding Innbundet
Utgitt 2012 Forlag
CAMBRIDGE UNIVERSITY PRESS
ISBN 9781605114095 Antall sider 212
Dimensjoner 15,2cm x 22,9cm x 1,3cm Vekt 450 gram
Leverandør Bertram Trading Ltd Andre medvirkende Edwin Piner, Kenji Shiojima, Mitsuo Fukuda, Osamu Ueda
Emner og form Materials science